JSM-6390 scanning electron microscope (SEM) with an accelerating voltage of 30 kV. The microscope operates in two modes: secondary electrons and back-scattered electrons.

JEM-2100 transmission electron microscope (TEM) with an accelerating voltage of 200 kV. Has a INCAx-sight attachment enabling elemental energy-dispersive analysis with a minimum region of 30 nm. Also, there is a convenient digital photo-camera for recording the images of microstructure.


Device for preparing specimens for transmission electron microscopy (TEM). Enables thinning foils by etching of their surface by Ar ion beam. The ion accelerating voltage is 1-8 kV, the gas for beam irradiation is 99.999% Argon. The ion tilt angle is 0-6 degrees.

Ion cleaner JIC-410

This unit is used to remove the contaminations on the TEM specimen. A specimen is placed in vacuum, and glow discharge is applied to clean the specimen.

Olympus GX51 optical microscope

The microscope is equipped by: 5 objective lenses enabling imaging with the magnifications 50х, 100х, 200х, 500х, 1000х; UC30 specialized digital video camera with a high resolution (3.2 megapixels); SCAN IM motorized scanning table with a stepper motor, with stop blocks; bright-field/dark-field integrated cubes; GX-PO polarizer enabling operation at all magnifications; licensed software.

Epiquant metallographic microscope Designed for microstructural study of metals and alloys, grain size evaluation, quantitative analysis of the grain structure.

Persons responsible for the laboratory:

Arthur Ganeev

Elvira Khafizova

Konstantin Nesterov

Marina Nikitina