JSM-6390 scanning electron microscope (SEM) with an accelerating voltage of 30 kV. The microscope operates in two modes: secondary electrons and back-scattered electrons.

JEM-2100 transmission electron microscope (TEM) with an accelerating voltage of 200 kV. Has a INCAx-sight attachment enabling elemental energy-dispersive analysis with a minimum region of 30 nm. Also, there is a convenient digital photo-camera for recording the images of microstructure.

ION SLICER EM-09100 IS

Device for preparing specimens for transmission electron microscopy (TEM). Enables thinning foils by etching of their surface by Ar ion beam. The ion accelerating voltage is 1-8 kV, the gas for beam irradiation is 99.999% Argon. The ion tilt angle is 0-6 degrees.

Ion cleaner JIC-410

This unit is used to remove the contaminations on the TEM specimen. A specimen is placed in vacuum, and glow discharge is applied to clean the specimen.

Olympus GX51 optical microscope

The microscope is equipped by: 5 objective lenses enabling imaging with the magnifications 50х, 100х, 200х, 500х, 1000х; UC30 specialized digital video camera with a high resolution (3.2 megapixels); SCAN IM motorized scanning table with a stepper motor, with stop blocks; bright-field/dark-field integrated cubes; GX-PO polarizer enabling operation at all magnifications; licensed software.

Epiquant metallographic microscope Designed for microstructural study of metals and alloys, grain size evaluation, quantitative analysis of the grain structure.

Persons responsible for the laboratory:

8

Arthur Ganeev
engineer

9

Elvira Khafizova
 researcher

10

Konstantin Nesterov
 researcher

Marina Nikitina
 researcher