Rigaku Ultima IV with Cu radiation: Qualitative/quantitative phase analysis in a temperature range from –300 С to +500 С.
Measurement of the lattice parameter (accuracy 0.00001 Angstrom), crystal lattice microdistortions, the CSD size and dislocation density in a temperature range from –300 C to +500 С. Measurement of the size and and distribution of nanopores and Guinier zones (particle aggregates from 1 to 50 nm) using low-angle diffraction at room temperature. Measurement of the residual macrostresses in parts of any configuration (GTE blades, etc.) at any point (d=1 mm). There is no need to cut our specimens for XRD from the parts. A part with a weight of up to 5 kg is mounted on a special holder for large samples. It is also possible to build distribution patterns of residual macrostresses (macrostress maps). Analysis of crystallographic textures in metals and alloys: direct pole figures (PF), inverse PF, orientation distribution function 2D and 3D (any sections, using the WIMW and Shultz methods), determination of texture types, volume fraction of the predominant orientations, activity of various systems (different lattice types), anisotropy of mechanical properties (dependence of mechanical properties in any direction of a sample). Analysis of thin films (liquid, polymers, oil wastes, organics, etc.).

X-ray diffractometer DRON-4m with Fе radiation with an attachment for fast billet rotation: Designed for qualitative/quantitative phase analysis, measurement of the lattice parameter (accuracy 0.0001 Angstrom), crystal lattice microdistortions, CSD size and dislocation density at room temperature.

X-ray diffractometer DRON-3m with Мо radiation with a multipurpose attachment: Designed for qualitative/quantitative phase analysis, measurement of the lattice parameter (accuracy 0.0001 Angstrom), crystal lattice microdistortions, CSD size and dislocation density at room temperature. Measurement of residual macrostresses in parts of any configuration at any point (d=1 mm). It is also possible to build distribution patterns of residual macrostresses (macrostress maps). Enables analyzing crystallographic textures in metals and alloys: direct pole figures (PF), inverse PF, orientation distribution function 2D and 3D, determination of texture types, volume fraction of the predominant orientations, activity of various systems (different lattice types), anisotropy of mechanical properties (dependence of mechanical properties in any direction of a sample).

Person responsible for the laboratory:

Vil Sitdikov
 researcher (PhD)