X-ray diffractometer DRON-4m with Fе radiation with an attachment for fast billet rotation: Designed for qualitative/quantitative phase analysis, measurement of the lattice parameter (accuracy 0.0001 Angstrom), crystal lattice microdistortions, CSD size and dislocation density at room temperature.
X-ray diffractometer DRON-3m with Мо radiation with a multipurpose attachment: Designed for qualitative/quantitative phase analysis, measurement of the lattice parameter (accuracy 0.0001 Angstrom), crystal lattice microdistortions, CSD size and dislocation density at room temperature. Measurement of residual macrostresses in parts of any configuration at any point (d=1 mm). It is also possible to build distribution patterns of residual macrostresses (macrostress maps). Enables analyzing crystallographic textures in metals and alloys: direct pole figures (PF), inverse PF, orientation distribution function 2D and 3D, determination of texture types, volume fraction of the predominant orientations, activity of various systems (different lattice types), anisotropy of mechanical properties (dependence of mechanical properties in any direction of a sample).